Bruker M4 TORNADO
Micro XRF is a rapid technique for acquiring qualitative and quantitative data at a very high spatial resolution (µm scale). The technique is rapid and non-destructive, and is used to quickly acquire qualitative and quantitative geochemical data at high spatial resolution (i.e. mm-scale). The M4 TORNADO is able to detect from sodium (Na) to uranium (U), making this the ultimate non-destructive tool available. Measurements are collected under vacuum or normal atmospheric conditions (air), with quantification limits ranging from parts per million to percentage.
- Produces elemental maps at micro scale (19 x 16 cm)
- Mineral Mapping through AMICS
- Quickly acquire qualitative and quantitative data at a high spatial resolution (µm scale)
- Complete control of tube parameters, filters, optical microscopes, sample illumination and sample positioning
- Measure in air or vacuum
- Up to 5 filters
- 1ms minimum dwell time per pixel
- Results presented as element distribution (line scan, mapping), quantification results, statistical evaluation
- Use Apeture Management System (AMS) for high depth of field and low energy dependent spot size variation
- Samples analysed with minimal to no sample preparation
- Measure solids, particles or liquids
- Record spectra
- Map uneven samples
- Quick-change stage with optional specimen holders, reducing sample exchange and setup time
Advanced Mineral Identification & Characterisation System known as AMICS, is a software that can provide advanced semi quantitative information on mineral abundance, assay grade, grain size and distribution, in addition to visualisation of the textures and spatial arrangements of the minerals.
A single dataset collected by the μ-XRF can provide both chemical information and mineralogy at a micro scale in spatial context. This offers detailed knowledge of samples to develop an advanced understanding of a deposit. Further to this, the practicality of μ-XRF use for commercial purposes advantageously bridges the gap between the small scale of Scanning Electron Microscopy (SEM), and analysis at the meter scale.