Micro XRF is a rapid technique for acquiring qualitative and quantitative data at a very high spatial resolution (µm scale). The technique is rapid and non-destructive, and is used to quickly acquire qualitative and quantitative geochemical data at high spatial resolution (i.e. mm-scale). The M4 TORNADO is able to detect from sodium (Na) to uranium (U), making this the ultimate non-destructive tool available. Measurements are collected under vacuum or normal atmospheric conditions (air), with quantification limits ranging from parts per million to percentage.

Main Features

  • Produces elemental maps at micro-scale (19 x 16 cm)
  • Mineral Mapping through AMICS
  • Quickly acquire qualitative and quantitative data at a high spatial resolution (µm scale)
  • Complete control of tube parameters, filters, optical microscopes, sample illumination and sample positioning
  • Measure in air or vacuum
  • Up to 5 filters
  • 1ms minimum dwell time per pixel
  • Results presented as element distribution (line scan, mapping), quantification results, statistical evaluation
  • Use Aperture Management System (AMS) for high depth of field and low energy dependent spot size variation

Other Features

  • Samples analysed with minimal to no sample preparation
  • Measure solids, particles or liquids
  • Record spectra
  • Map uneven samples
  • Quick-change stage with optional specimen holders, reducing sample exchange and setup time


Advanced Mineral Identification & Characterisation System known as AMICS, is a software that can provide advanced semi-quantitative information on mineral abundance, assay grade, grain size and distribution, in addition to visualisation of the textures and spatial arrangements of the minerals.

A single dataset collected by the μ-XRF can provide both chemical information and mineralogy at a micro-scale in a spatial context. This offers detailed knowledge of samples to develop an advanced understanding of a deposit. Further to this, the practicality of μ-XRF use for commercial purposes advantageously bridges the gap between the small scale of Scanning Electron Microscopy (SEM), and analysis at the meter scale.

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