Designed as a compact table top micro-XRF spectrometer, the Bruker M1 MISTRAL is a multipurpose tool. This micro-XRF is ideal for those with bulk materials and layer systems who are wanting to acquire data on thickness, layers and elemental composition of their samples. The Bruker M1 MISTRAL is widely used for multi-layered samples under 100 x 100 x 100 mm such as alloys, jewellery alloys, silver, and other metals. Maintenance is minimal on the M1 MISTRAL as samples are analysed non-destructively, meaning they are never damaged because of analysis.
Available with a large area silicon drift detector (SDD), which provides superior count rate performance and energy resolution allowing detection limits to reach as low as 0.01 wt. %.
M1 MISTRAL is the perfect addition to those wanting ease of analysis for RoHS and/or the characterisation of coatings. Being able to analyse for heavy trace metals in components of things such as electronics, plastics and toys and other alloys means that checking if a sample/s meets RoHS compliance is easy! Further to this, the M1 MISTRAL allows for the investigation of single or multi layers – perfect for those interested in coatings. The software linked to the M1 MISTRAL calculates layer thickness in addition to the standard data on composition through the use of standard-less fundamental parameter-based method.
Micro focus high performance tube with W or Rh target
30 mm² high performance silicon drift detector, <150 eV energy resolution at Mn Ka
Collimator changer for 0.1 mm to 1.5 mm
55 x 68 x 43 cm
48 x 49 x 20 cm³
Upto 1.8 kg
Up to 200 mm x 175 mm x 80 mm (for motorized XYZ stage with auto focus and EasyLoad function)
From Ti (Z=22) with W target (default)
From Al (Z=13) with Rh target (optional)
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